Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2006-08-15
2006-08-15
Dunn, Drew A. (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S368000, C359S380000
Reexamination Certificate
active
07092153
ABSTRACT:
The invention enables construction of a microscope that has one or more advantageous characteristics as compared to previous microscopes. The microscope can be small and lightweight and, in particular, sufficiently small and light weight to be portable (e.g., smaller and far lighter than probe station microscopes used for microscopic liquid crystal analysis of a semiconductor device). The microscope can include a small and lightweight bellows that provides zoom capability. The microscope and/or a tripod that is used with the microscope can be implemented to provide objective lens position control capability (with any number of translational and/or rotational degrees of freedom). The microscope can include apparatus for ejecting a hot gas from the microscope to heat a specimen being observed with the microscope.
REFERENCES:
patent: 1161556 (1915-11-01), Watkins
patent: 2077809 (1937-04-01), Riepert
patent: 2351753 (1944-06-01), Flint et al.
patent: 3610750 (1971-10-01), Lewis et al.
patent: 4018505 (1977-04-01), Peck
patent: 4431276 (1984-02-01), Weber
patent: 4625677 (1986-12-01), Neher
patent: 5671085 (1997-09-01), Gustafsson et al.
patent: 5880465 (1999-03-01), Boettner et al.
patent: 6005709 (1999-12-01), Silver
patent: 6094299 (2000-07-01), Schau et al.
patent: 6124144 (2000-09-01), Watanabe
patent: 6128127 (2000-10-01), Kusaka
patent: 6215586 (2001-04-01), Clark
patent: 6233093 (2001-05-01), Arnold et al.
patent: 6493135 (2002-12-01), Engelhardt
patent: 6563586 (2003-05-01), Stanke et al.
patent: 10-267943 (1998-10-01), None
Cypress Semiconductor Corporation
Dunn Drew A.
Graham David R.
Pritchett Joshua L
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