4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Neil R. Vanderschaaf

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Reduced pessimism clock gating tests for a timing analysis tool

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test method for guaranteeing full stuck-at-fault coverage of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Profile ID: LFUS-PAI-P-2725982

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