4. Semiconductor device manufacturing: process
  5. Making field effect device having pair of active regions...
  6. Having insulated gate

Nan Ya Technology Corporation

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Device used for detecting clamping force of processed object...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specimen clamp – holder – or support
Reexamination Certificate

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Incremental offset measurement instrument

Geometrical instruments – Gauge – With support for gauged article
Reexamination Certificate

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Manufacturing method and structure for aligner of liquid crystal

Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only
Patent

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Method and apparatus for detecting wafer flaw

Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate

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Method and structure for manufacturing contact windows in semico

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

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Profile ID: LFUS-PAI-P-206783

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