4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Nai-Yin Sung

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Method to design and verify an integrated circuit device...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method to verify the performance of BIST circuitry for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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System and measuring access time of embedded memories

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2454776

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