4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Physical design processing

Nafira Daud

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Method and apparatus for predicting system noise

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Method and system for analyzing input/output simultaneous...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2219999

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