4. Semiconductor device manufacturing: process
  5. Making device or circuit emissive of nonelectrical signal

Ming-Ji Dai

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Apparatus and method for measuring characteristic and chip...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Apparatus and method for measuring diode chip

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Encapsulation and methods thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With provision for cooling the housing or its contents
Reexamination Certificate

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Fabricating method of light emitting diode package

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal
Reexamination Certificate

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Flexible thermoelectric device

Batteries: thermoelectric and photoelectric – Thermoelectric – Electric power generator
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Profile ID: LFUS-PAI-P-2224714

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