4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Michele Quarantelli

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Layout for DUT arrays used in semiconductor wafer testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Sensing circuit for memory cells

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2561639

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