4. Facsimile and static presentation processing
  5. Static presentation processing
  6. Attribute control

Michael R. Magee

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Computation of die-per-wafer considering production...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Efficient database for die-per-wafer computations

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and system for varying die shape to increase wafer...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Method for improved color reproduction using linear mixing calcu

Facsimile and static presentation processing – Static presentation processing – Attribute control
Patent

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Profile ID: LFUS-PAI-P-1967464

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