4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Statistical measurement

Michael Murphree

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Extended defect sizing

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
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System and method for controlling a beam source in a...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Profile ID: LFUS-PAI-P-3078375

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