4. Heat exchange
  5. With timer, programmer, time delay, or condition responsive...
  6. Fluid pressure responsive or control

Michael Le Strange

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Containment of a wafer-chuck thermal interface fluid

Heat exchange – With timer – programmer – time delay – or condition responsive... – Fluid pressure responsive or control
Reexamination Certificate

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Edge-triggered master + LSSD slave binary latch

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Machine code builder derived power consumption reduction

Electrical computers and digital processing systems: support – Computer power control – Power conservation
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Wafer test apparatus including optical elements and method...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Workload partitioning in a parallel system with hetergeneous...

Data processing: software development – installation – and managem – Software program development tool – Translation of code
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Profile ID: LFUS-PAI-P-2277436

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