4. Etching a substrate: processes
  5. Nongaseous phase etching of substrate
  6. Using film of etchant between a stationary surface and a...

Michael J. Balconi-Lamica

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Accumulated current counter and method thereof

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Accumulated current counter and method thereof

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Apparatus for consolidating manufacturing of computing devices

Data processing: generic control systems or specific application – Specific application – apparatus or process – Article handling
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Arrangement and method for ESD protection

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Automatic reduction of data noise in installation packages...

Electrical computers and digital processing systems: multicomput – Network computer configuring – Initializing
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Profile ID: LFUS-PAI-P-2159963

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