4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Michael Fliesler

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Diode fabrication for ESD/EOS protection

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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ESD implant following spacer deposition

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method and apparatus for achieving bond pad crater sensing...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Overerase correction for flash memory which limits overerase and

Static information storage and retrieval – Floating gate – Particular biasing
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Photoresist spacer process simplification to eliminate the...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Profile ID: LFUS-PAI-P-298020

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