4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Michael Edward Scaman

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MEEF reduction by elongation of square shapes

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
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Method and apparatus for multi-stream detection of high density

Image analysis – Applications – Manufacturing or product inspection
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Method and structure for detection and measurement of...

Radiant energy – Irradiation of objects or material – Ion or electron beam irradiation
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Method and structure for detection of electromechanical...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Method and structure for reducing effects of noise and...

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
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Profile ID: LFUS-PAI-P-742913

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