4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Analyte supports

Michael DiBattista

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Hot stage for scanning probe microscope

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Patent

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Localized backside chip cooling with integrated smart valves

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With provision for cooling the housing or its contents
Reexamination Certificate

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Method and apparatus for controlling material removal from a...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and apparatus for controlling material removal from a...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and apparatus for controlling material removal from a...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1940602

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