4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Mi′schita′ Henson

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Damage assessment of a wafer using optical metrology

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Method and apparatus for aligning multiple outputs of an FPGA

Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
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Method for calculating environmental load, program for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Method of tracking the performance of an industrial appliance

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Structure-borne sound sensor unit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Profile ID: LFUS-PAI-P-2326396

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