4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Meindert J. Kleefstra

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Method and apparatus for establishing electrical contact between

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Method and apparatus for particle sizing

Data processing: measuring – calibrating – or testing – Measurement system – Article count or size distribution
Reexamination Certificate

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Particle sizing refinement system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate

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Vacuum activated backside contact

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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X-Ray analysis apparatus with pulse amplitude shift correction

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Profile ID: LFUS-PAI-P-1219367

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