4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Of specified material other than unalloyed aluminum

Mehdi Zamanian

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Barrier and landing pad structure in an integrated circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Patent

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Built-in frequency test circuit for testing the frequency of the

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Built-in frequency test circuit for testing the frequency of...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Reexamination Certificate

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Circuit and method of fabricating a memory cell for a static...

Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate

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CMOS integrated circuit device with LDD n-channel transistor...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-339937

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