Built-in frequency test circuit for testing the frequency of the

Details Built-in frequency test circuit for testing the frequency of the Built-in frequency test circuit for testing the frequency of the

1997-12-11

2000-05-02

Do, Diep N.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G01R 3126

Patent

active

060576995

ABSTRACT:
A frequency test circuit (200) includes a built-in self test (BIST) circuit (212) which provides for testing of a frequency generating circuit such as an oscillator circuit (100). The test circuit (200) includes circuit stages (202-208) which help produce a reference signal (210) which has substantially the same frequency as that produced by the oscillator circuit (100) when it is operational. Since the low current oscillator circuit (100) can fail at any one of the divider or level shifting stages (106-112), the test circuit (200) can determine if the reference signal and the output signal of the oscillator have substantially the same frequency and produce a test condition signal indicative of either a pass or failed test at test port (214).

REFERENCES:
patent: 4947382 (1990-08-01), Lesea
patent: 5099196 (1992-03-01), Longwell et al.
patent: 5266890 (1993-11-01), Kumbasar et al.
patent: 5796993 (1998-08-01), Maguire

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