4. Optics: measuring and testing
  5. Dimension
  6. Thickness

Matthias Slodowski

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Apparatus and method for thin-layer metrology

Optics: measuring and testing – Dimension – Thickness
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Apparatus and method for thin-layer metrology

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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Measurement system with an optical measurement arrangement

Optics: measuring and testing – Dimension – Thickness
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Method and apparatus for monitoring the light emitted from...

Optics: measuring and testing – Photometers – Photoelectric
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Method and apparatus for user guidance in optical inspection...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
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Profile ID: LFUS-PAI-P-2396381

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