4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Masayuki Yojima

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Apparatus for testing semiconductor wafer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Method and device for measuring height of object whose surface h

Optics: measuring and testing – Range or remote distance finding – With photodetection
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Profile ID: LFUS-PAI-P-701849

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