4. Coherent light generators
  5. Particular temperature control

Masaki Tomiya

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Apparatus wherein diffracted light does not return to the source

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Displacement measuring device with interference grating

Optics: measuring and testing – By light interference – Having polarization
Reexamination Certificate

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Displacement sensor including a heat insulating member partition

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Laser measuring apparatus

Coherent light generators – Particular temperature control
Patent

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Profile ID: LFUS-PAI-P-1160499

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