Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1993-11-22
1995-01-31
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356363, 250237G, G01B 902
Patent
active
053862910
ABSTRACT:
A displacement sensor is disclosed, which permits a semiconductor laser to be used as a light source with less thermal effects thereof. A spindle 18 with a scale 32 mounted thereon is disposed in a housing 11 or displacement. In the housing are also provided a semiconductor laser 35 for projecting a laser beam onto the scale and a transducer 36 for converting light form the scale into an electric signal. A heat insulation arrangement 41 is provided between the semiconductor laser 35 and the scale 32 to prevent transmission of heat from the semiconductor laser 35 to the scale 32. A heat radiation arrangement for radiating heat from the semiconductor laser 35 to the outside of the housing 11 is mounted in the housing 11. Thus, thermal effects of the semiconductor laser 35 on the scale 32 are reduced, and thus the accuracy of measurement is improved.
REFERENCES:
patent: 4676645 (1987-06-01), Taniguchi et al.
patent: 4691987 (1987-09-01), Ebner et al.
patent: 5283434 (1994-02-01), Ishizuka et al.
Itabashi Tatsuo
Sato Soichi
Tomiya Masaki
Kim Robert
Mitutoyo Corporation
Turner Samuel A.
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