4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Martin Nonnenmacher, deceased

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Calibration standard for 2-D and 3-D profilometry in the sub-nan

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Calibration standard for 2-D and 3-D profilometry in the sub-nan

Stock material or miscellaneous articles – Composite – Of inorganic material
Patent

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Calibration standard for 2-D and 3-D profilometry in the sub-nan

Semiconductor device manufacturing: process – With measuring or testing
Patent

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Force microscope and method for measuring atomic forces in multi

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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