4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Mark Lantz

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Probe for scanning over a substrate and a data storage device

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Probe for scanning over a substrate and a data storage device

Scanning-probe techniques or apparatus; applications of scanning – Applications of scanning-probe techniques other than spm
Reexamination Certificate

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