4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Mario Di Ronza

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Circuit device having a fuse

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Integrated memory and method for testing an integrated memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Data formatting to improve error detection correction...
Reexamination Certificate

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Memory built-in self repair (MBISR) circuits/devices and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2770664

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