4. Metal working
  5. Method of mechanical manufacture
  6. Electrical device making

Marc Fouchier

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Dual tip atomic force microscopy probe and method for...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
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Method for making probes for atomic force microscopy

Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3054720

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