Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
Reexamination Certificate
2009-02-06
2011-12-13
Berman, Jack (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Atomic force microscopy or apparatus therefor, e.g., afm probes
C850S033000
Reexamination Certificate
active
08079093
ABSTRACT:
One inventive aspect is related to an atomic force microscopy probe. The probe comprises a tip configuration with two probe tips on one cantilever arm. The probe tips are electrically isolated from each other and of approximately the same height with respect to the cantilever arm. The outer surface of the tip configuration has the shape of a body with a base plane and an apex. The body is divided into two sub-parts by a gap located approximately symmetrically with respect to the apex and approximately perpendicular to the base plane. Another inventive aspect related to methods for producing such an AFM probe.
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Berman Jack
IMEC
Knobbe Martens Olson & Bear LLP
Smith David E
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