4. Electricity: measuring and testing
  5. Measuring, testing, or sensing electricity, per se
  6. With rotor

Makoto Imura

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Method for contactless evaluation of characteristics of semicond

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Semiconductor substrate having a gettering layer

Active solid-state devices (e.g. – transistors – solid-state diode – With specified dopant – Deep level dopant
Patent

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Semiconductor substrate having a gettering layer

Active solid-state devices (e.g. – transistors – solid-state diode – With specified dopant – Deep level dopant
Patent

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Profile ID: LFUS-PAI-P-693280

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