4. Electricity: electrical systems and devices
  5. Safety and protection of systems and devices
  6. Load shunting by fault responsive means

Mainn-Gwo Chen

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Electrostatic discharge protective circuit formed by use of a si

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Patent

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Lifetime measurement of an ultra-thin dielectric layer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method of local oxidation using etchant and oxidizer

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Utility Patent

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Profile ID: LFUS-PAI-P-1904726

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