4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

M. Kathryn Braquet Tsirigotis

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In-circuit memory array bit cell threshold voltage...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Method for testing a semiconductor integrated circuit device

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
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Methods of placing transistors in a circuit layout and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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