4. Static information storage and retrieval
  5. Associative memories
  6. Ferroelectric cell

Liviu Calin

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At-speed built-in self testing of multi-port compact sRAMs

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Content addressable memory cells and words

Static information storage and retrieval – Associative memories – Ferroelectric cell
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2149463

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