4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Lee Ni Chung

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Built-in self test (BIST) technology for testing field...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Internal voltage level shifting for screening cold or hot...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3072565

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