Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2009-01-14
2011-10-04
Hollington, Jermele M (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
08030954
ABSTRACT:
Operation of an internal voltage supply level (Vgg) of an IC is characterized over operating temperature or at a selected temperature to determine a temperature-equivalent internal voltage level. The internal voltage supply of the IC is set to the temperature-equivalent level, and the IC is tested at room temperature to screen for low-temperature defects or high-temperature defects.
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Chung Lee Ni
Parthasarathy Srinivasa R.
Shi Jian Jun
Simmons Randy J.
Hewett Scott
Hollington Jermele M
Nguyen Tung X
Xilinx , Inc.
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