4. Optics: measuring and testing
  5. By polarized light examination
  6. Of surface reflection

Lawrence Rotter

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Flat spectrum illumination source for optical metrology

Optics: measuring and testing – Of light reflection
Reexamination Certificate

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Measurement system with separate optimized beam paths

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Measurement system with separate optimized beam paths

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Profile ID: LFUS-PAI-P-2989050

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