4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Lawrence Kraus

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Automatic generation of user definable memory BIST circuitry

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Built-in spare row and column replacement analysis system...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Carrier module for adapting non-standard instrument cards to...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Carrier module for adapting non-standard instrument cards to...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Carrier module for adapting non-standard instrument cards to...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-985775

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