Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2008-04-22
2008-04-22
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
Reexamination Certificate
active
07362089
ABSTRACT:
A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a single carrier module. The carrier module is then plugged into the test head of the test system. The carrier module provides circuitry, contained on a plug-in sub-module called an Application Interface Adapter (AIA), to interface between the instrument cards and the test head interface connector. Additionally, the AIA may also provide access from the instrument cards to ATE system calibration circuitry. The carrier module uses the standard data bus of the test system for housekeeping and control functions. A second bus provides the bus for the non-standard instrument cards. Software drivers provided with the instrument cards are encapsulated with an appropriate wrapper so that the cards run seamlessly in the software environment of the test system.
REFERENCES:
patent: 6028439 (2000-02-01), Arkin et al.
patent: 6462532 (2002-10-01), Smith
patent: 6587979 (2003-07-01), Kraus et al.
Rajsuman, R. “An Overview of The Open Architecture Test System”, Proceedings Delta 2004, Second IEEE International Workshop on Electronic Design, Test and Applications IEEE COMPUT. SOC, Los Alamitos, CA, Jan. 30, 2004, pp. 341-346.
Stora, M.E., “ATE Open System Platform IEEE P1552 Structured Architecture For Test Systems (SATS),” Institute of Electrical and Electronics Engineers, Autotestcon 2003 Proceedings. Sep. 22-25, 2003, IEEE Systems Readiness Technology Conference, New York, NY, pp. 85-94.
Rajsuman, R, “New Opportunity With The Open Architecture Test System”, Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific, Yokohama, Japan, Jan. 20-27, 2004, Piscataway, NJ, p. 335.
Lauterbach, M.J., “Building and Automated Test System Using Modular Signal Sources and Digitizers”, Autotestcon 2003 Proceedings. IEEE Systems Readiness Technology Conference, Anaheim, CA, Sep. 22-25, 2003, pp. 72-76.
Furukawa Yasuo
Getchell James
Kraus Lawrence
Kushnick Eric Barr
Advantest Corporation
Morrison & Foerster / LLP
Nguyen Ha Tran
Nguyen Trung Q.
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