4. Optics: measuring and testing
  5. Range or remote distance finding
  6. With photodetection

Kuo-Tso Chen

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Integrated circuit package and method of manufacture

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead
Reexamination Certificate

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Laser apparatus and method for speed measurement

Optics: measuring and testing – Velocity or velocity/height measuring – With light detector
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Method and apparatus to estimate burn-in time by measurement...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Substrate exposure apparatus

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With reflector – opaque mask – or optical element integral...
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Substrate exposure apparatus and method

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
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Profile ID: LFUS-PAI-P-2126953

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