4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Kuan-Min Lin

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Bonding pad with separate bonding and probing areas

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Flip-over alignment station for probe needle adjustment

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2721506

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