4. Data processing: measuring, calibrating, or testing
  5. Calibration or correction system
  6. Timing

Koichi Higashide

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Propagation delay time measuring method and testing apparatus

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Timing calibration method and semiconductor device testing...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Koichi Higashide does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Koichi Higashide, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Koichi Higashide will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2584464

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure