4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Synchronizing

Kevin M. Devereaux

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Fixture for burn-in testing of semiconductor wafers

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Frequency doubler and method of doubling frequency

Miscellaneous active electrical nonlinear devices – circuits – and – Specific input to output function – Combining of plural signals
Reexamination Certificate

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Method and apparatus for wafer level testing of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Method for realizing an improved radio frequency detector for us

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing
Patent

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Method for wafer level testing of semiconductor using...

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to nonconductive state
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1134921

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