4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Keun-ho Lee

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Method of calculating parasitic capacitance between...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Method of extracting interconnection capacitance of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Phase change memory array

Static information storage and retrieval – Systems using particular element – Amorphous
Reexamination Certificate

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Phase change memory devices including memory elements having...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2558822

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