4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Kenji Nishi

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Aligning apparatus and method for aligning mask patterns...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Aligning apparatus and method for aligning mask patterns...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Aligning device for exposure apparatus

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Aligning method and apparatus

Image analysis – Applications – Manufacturing or product inspection
Patent

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Alignment apparatus

Photocopying – Projection printing and copying cameras – Identifying – composing – or selecting
Patent

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Profile ID: LFUS-PAI-P-55533

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