Keith H. Bierman

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Method and apparatus for accelerated post-silicon testing...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Event-driven
Reexamination Certificate

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Method for providing cycle-by-cycle ad HOC verification in a...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate

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System and method for checking the use of synchronization locks

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Profile ID: LFUS-PAI-P-535761

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