Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Event-driven
Reexamination Certificate
2006-11-07
2006-11-07
Shah, Kamini (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Event-driven
C703S014000, C703S015000, C702S117000, C702S119000, C702S120000, C716S030000
Reexamination Certificate
active
07133818
ABSTRACT:
A method of providing accelerated post-silicon testing for a silicon hardware includes computing a simulation cumulative record of state using a plurality of test instructions and a cycle breakpoint, performing a simulation of an instrumented logic design using the plurality of test instructions and the cycle breakpoint, manufacturing the silicon hardware using the instrumented logic design, computing a silicon cumulative record of state by executing the plurality of instructions using the silicon hardware; and comparing the simulation cumulative record of state to the silicon cumulative record of state.
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Bierman Keith H.
Chen Liang T.
Emberson David R.
Luu Cuong Van
Osha & Liang LLP
Shah Kamini
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