4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Fluorescence

Kazuo Nishihagi

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Surface defect evaluating apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Total reflection X-ray fluorescence apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Total reflection X-ray fluorescence apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Total reflection X-ray fluorescence apparatus

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Profile ID: LFUS-PAI-P-1197238

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