4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Kazuhiro Takaoka

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Apparatus for measuring thickness of plate-shaped article

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Case packer

Package making – With means responsive to a sensed condition – Separate delivery of incomplete or defective contents or...
Patent

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Conveyance device and packing device provided therewith

Conveyors: power-driven – Conveyor system for establishing and moving a group of items – Subdivides continuous item stream into longitudinally spaced...
Reexamination Certificate

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Method of and apparatus for measuring pattern positions

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method of and apparatus for measuring pattern positions

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Profile ID: LFUS-PAI-P-829573

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