4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Katsumi Fujihara

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Measurement apparatus and measurement method

Optics: measuring and testing – Velocity or velocity/height measuring – With light detector
Reexamination Certificate

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Pattern inspection system

Image analysis – Histogram processing – For setting a threshold
Patent

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Pattern inspection system

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-1466860

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