Measurement apparatus and measurement method

Details Measurement apparatus and measurement method Measurement apparatus and measurement method

2007-04-30

2009-12-15

Alsomiri, Isam (Department: 3662)

Optics: measuring and testing

Velocity or velocity/height measuring

With light detector

C356S152200, C356S614000

Reexamination Certificate

active

07633602

ABSTRACT:
A measurement apparatus having a measurement light source for emitting measurement light, a projection unit on which reflected light formed when the measurement light is reflected from the mirror plane is projected as a projected light spot, an image pickup unit for picking up an image of the projection unit on which the reflected light is projected as the projected light spot, a control unit for controlling an inclination of the mirror plane and a measurement unit for measuring a quantity of movement of the projected light spot, which moves according to a change of the inclination of the mirror plane, on the basis of the image of the projection unit. This enables the measurement of a deflection characteristic of a mirror system having the mirror plane variable to arrange the inclination within a short period of time and with high accuracy.

REFERENCES:
patent: 5015866 (1991-05-01), Hayashi
patent: 5151749 (1992-09-01), Tanimoto et al.
patent: 7305188 (2007-12-01), Yamashita et al.
patent: 2003/0174382 (2003-09-01), Massieu
patent: 2005/0200984 (2005-09-01), Browne et al.
patent: 2005/0213978 (2005-09-01), Yamashita et al.
patent: 06-147987 (1994-05-01), None
patent: 7-55704 (1995-03-01), None
patent: 7-55716 (1995-03-01), None
patent: 2002-005853 (2002-01-01), None
patent: 2005-003389 (2005-01-01), None
patent: 2005-283932 (2005-10-01), None
patent: 10-0159136 (1995-03-01), None
Korean Office Action dated Apr. 30, 2008, issued in corresponding Korean Patent Application No. 10-2007-0051431 with English translation.

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