4. Measuring and testing
  5. Instrument proving or calibrating
  6. Displacement, motion, distance, or position

Karl Kobler

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Method and apparatus for machining semiconductor material

Abrading – Abrading process – With tool treating or forming
Patent

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Method for calibrating rotating tools

Measuring and testing – Instrument proving or calibrating – Displacement – motion – distance – or position
Patent

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Profile ID: LFUS-PAI-P-1555699

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