Measuring and testing – Instrument proving or calibrating – Displacement – motion – distance – or position
Patent
1998-07-24
2000-05-02
Raevis, Robert
Measuring and testing
Instrument proving or calibrating
Displacement, motion, distance, or position
H04N 718
Patent
active
060558423
ABSTRACT:
A method for monitoring the calibration of and calibrating rotating tools ich are liable to deviate, wherein at least one known deviation is recorded at a first predetermined rotational speed. The method can be used with annular saws that divide workpieces into semiconductor wafers.
REFERENCES:
patent: 3039235 (1962-06-01), Heinrich et al.
patent: 3175548 (1965-03-01), Weiss
patent: 3681978 (1972-08-01), Mathias et al.
patent: 4763533 (1988-08-01), Uitermarkt
patent: 4942611 (1990-07-01), Kunugi et al.
patent: 5642159 (1997-06-01), Oba
Derwent Abstract Corresponding to DE 34 42730, Aug. 1986.
Derwent Abstract Corresponding to DE 28 41 653, Sep. 1982.
Kobler Karl
Malcok Hanifi
Zwirglmaier Hermann
Raevis Robert
Wacker Siltronic Gesellschaft fur Halbleitermaterialien AG
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